3D test chart, adjusting arrangement, forming method and adjusting method thereof

ABSTRACT

A 3D test chart, an adjusting arrangement, a forming method, and an adjusting method thereof are disclosed. The 3D test chart provides a plurality of test patterns arranged at different depths. When testing a photographic arrangement, the photographic arrangement is only required to move for one time or even does not need to be moved, so as to obtain an image containing information of different depths, so that the testing and adjusting process of the photographic arrangement can be easily achieved.

CROSS REFERENCE OF RELATED APPLICATION

This application is a Divisional application that claims the benefit ofpriority under 35 U.S.C. § 120 to a non-provisional application,application Ser. No. 14/872,014, filed Sep. 30, 2015 which isincorporated herewith by reference in its entity.

NOTICE OF COPYRIGHT

A portion of the disclosure of this patent document contains materialwhich is subject to copyright protection. The copyright owner has noobjection to any reproduction by anyone of the patent disclosure, as itappears in the United States Patent and Trademark Office patent files orrecords, but otherwise reserves all copyright rights whatsoever.

BACKGROUND OF THE PRESENT INVENTION Field OF Invention

The present invention relates to the field of optical system, and moreparticularly to a 3D test chart, adjusting arrangement, forming methodand adjusting method thereof, wherein the 3D test chart is arranged forproviding a plurality of test patterns of different depths, so that aphotographic arrangement to be tested, which is only required to bemoved for one time or even do not need to be moved, is able to obtainimages of various different depths, so that a user is able to quicklytest and adjust the photographic arrangement.

Description of Related Arts

Along with the fast and intelligent development of science andtechnology, such as the development in the field of electronicengineering and communication engineering, the photographic arrangementwhich is used for obtaining images and videos and serving as the mediumfor expanding human's visions, has become a core component which iswidely used in various electronic devices. For instance, an electronicproduct, such as a smart phone, a tablet computer, a notebook computer,a personal computer terminal device, a PDA (personal digital assistant),a transportation tool, a medical device, and a monitoring device, hasbeen provided with at least one camera device by implanting the cameradevice into the ecosystem to form a camera system for obtain image orvideo information of the environment. It can be made a conclusion thatthe fast development of these electronic products has caused thethriving of the field of the camera devices.

In order to enhance the user experience and expand the application depthof these products, more and more photographic arrangements are developedto be miniaturized, microminiaturized, as well as are developed withhigher imaging quality, thus the volume of the camera device has beenlimited to be smaller and smaller with respect to this trend. Therefore,how to increase the imaging quality and guarantee the yield rate of thecamera devices while minimize the volume as small as possible is thedeveloping direction and breaking point of this technical field.

A photographic arrangement generally comprises a photographic module, animage sensor and other components such as a holder. When assembling thephotographic module with the image sensor, the tilt of the image planeof the lens of the photographic module, the tilt tolerance of othercomponents of the photographic module, and the tilt resulting from thepackaging process will cause the tilt and shift between the photographicmodule and the image sensor, and finally adversely influence the imagingquality of the photographic system. Therefore, it is an indispensableprocedure to adjust the positions of the image plane of the photographicmodule and the light receiving plane of the image sensor to solve theproblem of the tilt and shift theretween before fixing up thephotographic module with the image sensor of the photographicarrangement.

The above mentioned procedure includes a testing process and anadjusting process. A conventional testing process of an optical system,which can be carried out by an orthographic projection method (employinga transmissive or reflective test chart) or a back projection method(employing a transmissive test chart), generally relies on moving thephotographic module or the test chart to adjust the relative position ofthe photographic module to be tested with respect to the test chart orthe image sensor, so as to obtain the functional relationship betweenthe imaging quality and the defocus curve, and then calculate the focuspoint and tilt vector of each target to obtain the relative tilt of thephotographic module with respect to the test chart or the image sensor,and carry out the adjusting process based on the relative tilt thereof.However, this conventional method for testing optical systems has anadverse disadvantage that greatly influences the testing and adjustingefficiency. More specifically, it takes a lot of time for theconventional testing device to gradually move its components to obtainthe functional relationship between the imaging quality and the defocuscurve. Furthermore, during the testing process of the photographicarrangement, when the incline angle of the image plane of thephotographic module is relatively large, in order to collect data ofhigher focus point of the target, the photographic module is required tobe moved with a relatively large distance, but when the photographicmodule is moved towards the image senor, it may clash on othercomponents or cause the bonding glue to slip off, and thus resulting inthe failure of the test and the correction. In addition, theconventional testing device is bulky in size and occupying a lot ofspace, so that it is relatively expensive for testing the photographicarrangement.

In addition, the conventional testing device, which is assembledaccording to the conventional testing and adjusting principle for thephotographic arrangement, should spare a relative large space forguaranteeing the moving displacement of the photographic arrangement, sothat the volume of the convention testing device is relatively large andthe structure is also complicated, and it is not likely to be widelyused because it takes a lot of time for carrying out the operation onethe photographic arrangement with the testing device and the cost isrelatively high. Therefore, providing a testing device which cansignificantly improve the imaging quality of the photographicarrangement, reducing the volume and cost of the testing and adjustingdevice, as well as facilitating the focusing of the photographicarrangement and the adjusting the tilt of the image plane, remains aproblem to be solved in this industry.

SUMMARY OF THE PRESENT INVENTION

A main object of the present invention is to provide a 3D test chart, anadjusting arrangement, a forming method and an adjusting method thereof,wherein the 3D test chart is arranged for providing a plurality of testpatterns of different depths, so that a photographic arrangement to betested, which is only required to be moved for one time or even do notneed to be moved, is able to obtain images of various different depths,so that a user is able to quickly test and adjust the photographicarrangement.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein when the 3D test chart is used for testing thephotographic arrangement, the photographic arrangement is only requiredto be moved at most for one time before obtaining the functionalrelationship between the imaging quality of the photographic arrangementand the related data and parameters, and then the relative position andthe tilt between the photographic module of the photographic arrangementand the image sensor, so as to reduce operation procedures.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the 3D test chart allows the user to simultaneouslyanalysis the focal length and the tilt of the image plane of thephotographic arrangement by just shooting for one time, so as to obtainthe corresponding data for facilitating the subsequent adjustingprocess.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the 3D test chart is able to provide a plurality ofscenes of different depths, so that in compassion with the conventionaltesting device, the 3D test chart enables the testing device of thepresent invention to be designed much smaller, so that the spacereserved for enabling the movement of the components of the photographicarrangement is omitted in the present invention, so as to reduce thevolume of the testing device as much as possible.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the 3D test chart meets the requirement of the trend ofthe photographic arrangement as being relatively small and miniature,and also solves the bottleneck problem of the conventional procedure inwhich the photographic module and the image sensor may bump or clash onthe components at a bottom side of the testing device when the relativeposition therebetween is being adjusted.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the 3D test chart is able to provide at least one testpattern in different planes and may provide at least one test pattern atdifferent positions in a same plane, thus the photographic arrangement,which can be arranged in a static state, is able to capture testpatterns of different depths of the 3D test chart, so as to provide datafor a subsequent resolution analysis step of the photographicarrangement.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the 3D test chart can be replaced according todifferent requirements, and the size and the specification of the 3Dtest chart also can be adjusted, so that it is convenient to use.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the 3D test chart can be embodied as any test chartwhich can provide scenes of different depths as well as guarantee thesuitable image contrast, such as a transmissive test chart, a reflectivetest chart, a projective test chart, and a focus zoom test chart.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the pattern of the test pattern of the 3D test chartcan be any pattern as long as the pattern can be used to calculate theimaging quality of the photographic arrangement, such as a triangularshape, a circular shape, an oval shape, a pair of black and white lines,a cross shape, a star shape and the combination thereof, so as tofacilitate the selection and preparation of the 3D test chart.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein an excessive noise is avoided when the test patternsare used to test the photographic arrangement and analyze theresolution, so that the test result can be precise and correct.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein incorporating the plurality of test patterns into the3D test chart enables the user to obtain more data reflecting theresolution of the photographic arrangement, so as to make sure that theadjusting of the photographic arrangement can be effectivelyaccomplished.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein in a same filed view, when the plurality of layers ofthe test patterns is captured by the photographic module of thephotographic arrangement, image planes of the photographic module of thephotographic arrangement will not interfere with each other, so as toguarantee the reliability and precision of the testing result.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the 3D test chart can be embodied as a cross type 3Dtest chart which has test patterns of different depths, such as crosstype test patterns which are not sensitive to errors, so that thecontrast between the cross type test patterns and the carrier layers isalways guaranteed when the cross type 3D test chart is employed to testthe photographic arrangement, and thus it is easy for the photographicarrangement to obtain the information of the corresponding cross typetest patterns.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein more cross type test patterns can be arranged in alimited area of the cross type 3D test chart, so that when the crosstype patterns are projected to the image space, more pixel points canoccupy the area of the image, so as to facilitate the calculation of thetesting result.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein more cross type test patterns can be arranged in alimited area of the cross type 3D test chart, so that the pattern of thecombination of the test patterns of the cross type 3D test chart can besignificantly abounded, so that more data reflecting the resolution ofthe photographic arrangement can be obtained, so as to facilitate thesubsequent step of the obtaining of the testing result.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the configuration of each of the cross type testpatterns of the cross type 3D test chart can be adjusted according toactual requirements, so as to reduce the testing time of thephotographic arrangement, and thus further reduce the cost of the use ofthe cross type 3D test chart.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the graph of the cross type test pattern is simple,easy to prepare, and is suitable for many testing occasions, so that thetesting and manufacturing cost for the photographic arrangement isreduced.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the cross type 3D test chart allows the user to employany method to evaluate the resolution of the photographic arrangement,such as MTF (Modulation Transfer Function) method, and calculate thefocal point and tilt of the image plane of the photographic arrangement,so as to expand the application range.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein in comparison with the conventional testing method, themethod, which introduces the 3D test chart with scenes of differentdepths to test and adjust the relative position of the photographicmodule and the image sensor of the photographic arrangement, reduces thesteps of the procedure as well as the consumption time for testing andadjusting the photographic arrangement.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein by establishing a plurality of layers of test patterns,which are not overlapped with each other, along the direction of thedepth in this method, it is possible for enabling the photographicarrangement to obtain images of different depths in one single step andaccomplish the testing and adjusting procedure.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the method may only require at the very least shootingone time to provide one picture for obtaining the functionalrelationship between the imaging quality and the defocus curve of thephotographic module and the image sensor, so as to simply the testingprocess.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein in the method, the photographic arrangement is onlyrequired to be moved a few times (i.g. one to three times of moving, oreven no moving step) before obtaining parameters reflecting the imagingquality of the photographic arrangement as well as other data, so thatthe user can adjust the relative position of the photographicarrangement and the image sensor based on the data, including adjustingthe focal length and the tilt of the image plane.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the method enables simultaneously test of the focallength and the tilt of the image plane of the photographic arrangement,as well as synchronous adjustment, so that the efficiency is greatlyimproved.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein the method can be introduced to decrease the errortolerance of the photographic arrangement, and bring down the influenceof the assembling procedure acting on the imaging quality, so that theimaging performance of the photographic arrangement is greatly improved.

Another object of the present invention is to provide a 3D test chart,an adjusting arrangement, a forming method and an adjusting methodthereof, wherein since the photographic arrangement is only required tobe moved a few times during the testing procedure, the adjustingarrangement, which is designed based on the adjusting method of thepresent invention, is not required to reserve a relatively large spacefor enabling the movement of the components of the photographicarrangement, so that the volume and cost of the adjusting arrangementcan be reduced.

Additional advantages and features of the invention will become apparentfrom the description which follows, and may be realized by means of theinstrumentalities and combinations particular point out in the appendedclaims.

According to the present invention, the foregoing and other objects andadvantages are attained by a 3D test chart comprising a plurality oftest chart layers arranged in a direction along a depth thereof, whereineach of the test chart layers is provided with at least one testpattern, wherein in the direction along the depth, each of the testpattern of one of the test chart layers does not overlap with other thetest patterns of other the test chart layers.

According to an embodiment of the present invention, in the above 3Dtest chart, set a as a parameter which represents a precisionrequirement for fitting a back focus of a photographic arrangement to betested, set EFL as a parameter which represents a focal length, set h asa parameter which represent a position configuration of the 3D testchart, wherein h_(j) represents a position of jth layer of the testchart layers, wherein a functional equation regarding a positionconfiguration of the test chart layers is as follows:a=−((EFL*(−hj)/(EFL−hj)−(EFL*(−h)/(EFL−h))).

According to an embodiment of the present invention, in the above 3Dtest chart, set n as a parameter which represents a quantity of the testchart layers, set t as a parameter which represents an error toleranceof the photographic arrangement, set s as a parameter which represents aquantity of moving steps of the photographic arrangement, and then afunctional equation regarding the quantity of the test pattern payers isas follows: n=f(t, a, s).

According to an embodiment of the present invention, in the above 3Dtest chart, set d as a parameter which represents a layout of the testpatterns, wherein d_(ij) is a parameter which represents a distance fromone of the test pattern of the corresponding test chart layer to acenter of the test chart layer, set F as a parameter which represents atesting field of view of the photographic arrangement, wherein afunctional equation regarding the layout of the test patterns is asfollows: d_(ij)=f′(F, h_(ij), EFL).

According to an embodiment of the present invention, in the above 3Dtest chart, set L as a parameter which represents a size of each crosstype test pattern and L_(ij) is a parameter representing a size of ithtest pattern of jth test chart layer, set t′ as a parameter whichrepresents an error tolerance for manufacturing the 3D test char, set n′as the parameter which represents an index of refraction of the 3D testchart, set s′ as a parameter which represents an allowable disc ofconfusion during a calculating step of a software, set ΔF as a parameterwhich represents an allowable range of a span of testing field of view,and a functional equation regarding the size of the test pattern is asfollows: L_(ij)=f(dij, ΔF, t′, n′, s′).

According to an embodiment of the present invention, in the above 3Dtest chart, a shape of the test pattern is selected from the groupconsisting of a square shape, a triangular shape, a circular shape, anoval shape, a cross shape, a shape of a pair of black and white lines, astar shape and the combination thereof.

According to an embodiment of the present invention, in the above 3Dtest chart, the 3D test chart comprises 2 to 100 layers of the testchart layers each is provided with 1-1000 the test patterns.

According to an embodiment of the present invention, in the above 3Dtest chart, the 3D test chart is formed as a chart selected from thegroup consisting of a transmissive test chart, a reflective test chart,a projection test chart, and a focus zooming and imaging type testchart.

According to an embodiment of the present invention, in the above 3Dtest chart, each of the test chart layers comprises at least one carrierlayer, wherein adjacent the carrier layers are spacedly aligned witheach other, wherein each of the test patterns is provided at thecorresponding carrier layer.

According to an embodiment of the present invention, in the above 3Dtest chart, each of the carrier layers is made of transparent material.

According to another aspect of the present invention, the presentinvention further provides a 3D test chart, wherein the 3D test chartcomprises a plurality of test patterns which are arranged in a directionalong a depth thereof, wherein the test patterns do not overlap witheach other, wherein two adjacent the test patterns are spacedly alignedwith each other.

According to an embodiment of the present invention, in the above 3Dtest chart, further comprising a plurality of carrier layers which arespacedly aligned with each other to form a plurality of test chartlayers, wherein each of the test patterns is provided at thecorresponding test chart layer.

According to an embodiment of the present invention, in the above 3Dtest chart, a shape of the test pattern is selected from the groupconsisting of a square shape, a triangular shape, a circular shape, anoval shape, a cross shape, a shape of a pair of black and white lines, astar shape and the combination thereof.

According to an embodiment of the present invention, in the above 3Dtest chart, the 3D test chart comprises 2 to 100 layers of the testchart layers each is provided with 1-1000 the test patterns.

According to another aspect of the present invention, the presentinvention further provides a method of designing a 3D test chart,comprising the following steps: (A) collecting a plurality of parametersof a photographic arrangement to be tested, and determining a positionconfiguration of the 3D test chart; and (B) based on a precisionrequirement of the photographic arrangement, determining a quantity oftest chart layers, and configuring a layout of test patterns of the testchart layers.

According to an embodiment of the present invention, in the abovemethod, the step (B) further comprises a step of determining a size ofeach of the test patterns.

According to an embodiment of the present invention, in the abovemethod, the step (A) further comprises the steps of setting a as aparameter which represents a precision requirement for fitting a backfocus of the photographic arrangement to be tested, setting EFL as aparameter which represents a focal length, setting h as a parameterwhich represent a position configuration of the 3D test chart, whereinh_(j) represents a position of jth layer of the test chart layers, andobtaining a functional equation regarding a position configuration ofthe test chart layers as follows:a=−((EFL*(−hj)/(EFL−hj)−(EFL*(−h)/(EFL−h))).

According to an embodiment of the present invention, in the abovemethod, the step (A) further comprising the steps of setting n as aparameter which represents a quantity of the test chart layers, settingt as a parameter which represents an error tolerance of the photographicarrangement, setting s as a parameter which represents a quantity ofmoving steps of the photographic arrangement, and obtaining a functionalequation regarding the quantity of the test pattern payers as follows:n=f(t, a, s), wherein the step (A) further comprising the steps ofsetting d as a parameter which represents a layout of the test patterns,wherein d_(ij) is a parameter which represents a distance from one ofthe test pattern of the corresponding test chart layer to a center ofthe test chart layer, setting F as a parameter which represents atesting field of view of the photographic arrangement, and obtaining afunctional equation regarding the layout of the test patterns asfollows: d_(ij)=f(F, h_(ij), EFL).

According to an embodiment of the present invention, in the abovemethod, further comprising the steps of setting L as a parameter whichrepresents a size of each test pattern and L_(ij) is a parameterrepresenting a size of ith test pattern of jth test chart layer, settingt′ as a parameter which represents an error tolerance for manufacturingthe 3D test chart, setting n′ as the parameter which represents an indexof refraction of the 3D test chart, setting s′ as a parameter whichrepresents an allowable disc of confusion during a calculating step of asoftware, setting ΔF as a parameter which represents an allowable rangeof a span of testing field of view, and obtaining a functional equationregarding the size of the test pattern as follows: L_(ij)=f(dij, ΔF, t′,n′, s′).

According to an embodiment of the present invention, in the abovemethod, a shape of the test pattern is selected from the groupconsisting of a square shape, a triangular shape, a circular shape, anoval shape, a cross shape, a shape of a pair of black and white lines, astar shape and the combination thereof.

According to another aspect of the present invention, the presentinvention further provides a method of forming a 3D test chart,comprising the following steps: (a) determining at least onepredetermined area at a test chart layer, providing at least one testpattern at the predetermined area; and (b) overlapping a plurality ofthe test chart layers in such a manner that the test patterns do notoverlap with each other, so as to form the 3D test chart.

According to an embodiment of the present invention, in the abovemethod, further comprising a step of projecting light beams to the testchart layers, wherein a contrast between the test pattern and thecorresponding test chart layer is enhanced.

According to an embodiment of the present invention, in the abovemethod, further comprising a step of configuring at least one lightsource in such a manner that the light source and a photographicarrangement to be tested are respectively provided at two opposite sidesof the 3D test chart, wherein light beams of the light sources passthrough the test chart layers.

According to an embodiment of the present invention, in the abovemethod, further comprising a step of configuring at least one lightsource in such a manner that the light source and a photographicarrangement to be tested are provided at a same side of the 3D testchart, wherein light beams of the light sources are reflected by thetest patterns.

According to an embodiment of the present invention, in the abovemethod, the light beams reaching to the test chart layers are evenlydistributed light beams.

According to another aspect of the present invention, the presentinvention further provides a method of forming a 3D test chart,comprising a step of configuring a projection source in a light path ofa light source in such a manner that when the light source produceslight beams, a plurality of test patterns which do not overlap with eachother is formed in a predetermined space in a direction along a depththereof by the projection source, wherein two adjacent the test patternsare spacedly aligned with each other to form the 3D test chart.

According to an embodiment of the present invention, in the abovemethod, the projection source is provided between the light source andthe predetermined space.

According to an embodiment of the present invention, in the abovemethod, the projection source comprises a planar test chart and a focuszooming lens set, wherein the planar test chart is provided between thelight source and the focus zooming lens set in such a manner that thefocus zooming lens set and light beams of the light source are able toproject information of the planar test chart to the predetermined space.

According to an embodiment of the present invention, in the abovemethod, the planar test chart comprises at least one testing objectwhich is capable of being projected to the predetermined space by meansof the focus zooming lens set, so as to form the test patterns.

According to an embodiment of the present invention, in the abovemethod, a shape of the test pattern is selected from the groupconsisting of a square shape, a triangular shape, a circular shape, anoval shape, a cross shape, a shape of a pair of black and white lines, astar shape and the combination thereof.

According to another aspect of the present invention, the presentinvention further provides a method of forming a cross type 3D testchart, comprising a step of configuring a plurality of cross type testpatterns which are arranged in a direction along a depth thereof,wherein image elements formed by the corresponding cross type testpatterns which are respectively projected into an image do not overlapwith each other.

According to an embodiment of the present invention, in the abovemethod, further comprising the steps of: determining at least onepredetermined area at a test chart layer, providing at least one thecross type test pattern at the predetermined area; and overlapping aplurality of the test chart layers in such a manner that the cross typetest patterns do not overlap with each other, so as to form the 3D testchart.

According to an embodiment of the present invention, in the abovemethod, further comprising the steps of collecting a plurality ofparameters of a photographic arrangement to be tested, and determining aposition configuration of the cross type 3D test chart and a quantity ofthe test chart layers.

According to an embodiment of the present invention, in the abovemethod, further comprising the steps of setting a as a parameter whichrepresents a precision requirement for fitting a back focus of thephotographic arrangement to be tested, setting EFL as a parameter whichrepresents a focal length, setting h as a parameter which represent aposition configuration of the cross type 3D test chart, wherein h_(j)represents a position of jth layer of the test chart layers, andobtaining a functional equation regarding a position configuration ofthe test chart layers as follows:a=−((EFL*(−hj)/(EFL−hj)−(EFL*(−h)/(EFL−h))), wherein the method furthercomprising the steps of setting n as a parameter which represents aquantity of the test chart layers, setting t as a parameter whichrepresents an error tolerance of the photographic arrangement, setting sas a parameter which represents a quantity of moving steps of thephotographic arrangement, and obtaining a functional equation regardingthe quantity of the test pattern payers as follows: n=f(t, a, s).

According to an embodiment of the present invention, in the abovemethod, further comprising a step of determining a layout of the crosstype test patterns.

According to an embodiment of the present invention, in the abovemethod, further comprising the steps of setting d as a parameter whichrepresents a layout of the cross type test patterns, wherein d_(ij) is aparameter which represents a distance from one of the cross type testpattern of the corresponding test chart layer to a center of the testchart layer, setting F as a parameter which represents a testing fieldof view of the photographic arrangement, and obtaining a functionalequation regarding the layout of the cross type test patterns asfollows: d_(ij)=f(F, h_(ij), EFL).

According to an embodiment of the present invention, in the abovemethod, further comprising the steps of setting L as a parameter whichrepresents a size of each cross type test pattern and L_(ij) is aparameter representing a size of ith test pattern of jth test chartlayer, setting t′ as a parameter which represents an error tolerance formanufacturing the cross type 3D test char, setting n′ as the parameterwhich represents an index of refraction of the cross type 3D test chart,setting s′ as a parameter which represents an allowable disc ofconfusion during a calculating step of a software, setting ΔF as aparameter which represents an allowable range of a span of testing fieldof view, and obtaining a functional equation regarding the size of thecross type test pattern as follows: L_(ij)=f(dij, ΔF, t′, n′, s′).

According to an embodiment of the present invention, in the abovemethod, further comprising a step of configuring a layout of a pluralityof cross type image elements in an image generated by a photographicarrangement, and configuring a layout of the cross type test patternscorresponding to the cross type image elements in the image by aninverse projection method.

According to an embodiment of the present invention, in the abovemethod, further comprising a step of configuring a projection source ina light path of a light source in such a manner that when the lightsource produces light beams, a plurality of the cross type test patternswhich do not overlap with each other is formed in a predetermined spacein a direction along a depth thereof by the projection source, whereinthe projection sources comprises at least one cross type test object.

According to an embodiment of the present invention, in the abovemethod, the projection source comprises a planar test chart and a focuszooming lens set, wherein the planar test chart, which is arranged toprovide the cross type test object, is provided between the light sourceand the focus zooming lens set in such a manner that the focus zoominglens set and light beams of the light source are able to projectinformation of the planar test chart to the predetermined space.

According to an embodiment of the present invention, in the abovemethod, sizes of the cross type test patterns of each of the test chartlayer are the same or different.

According to another aspect of the present invention, the presentinvention provides a cross type 3D test chart comprising a plurality oftest chart layers arranged in a direction along a depth thereof, whereineach of the test chart layers is provided with at least onepredetermined area each is provided with one or more cross type testpatterns, wherein in the direction along the depth, each of the crosstype test pattern of one of the test chart layers does not overlap withother the cross type test patterns of other the test chart layers.

According to an embodiment of the present invention, in the above crosstype 3D test chart, set a as a parameter which represents a precisionrequirement for fitting a back focus of a photographic arrangement to betested, set EFL as a parameter which represents a focal length, set h asa parameter which represent a position configuration of the cross type3D test chart, wherein h_(j) represents a position of jth layer of thetest chart layers, wherein a functional equation regarding a positionconfiguration of the test chart layers is as follows:a=−((EFL*(−hj)/(EFL−hj)−(EFL*(−h)/(EFL−h))).

According to an embodiment of the present invention, in the above crosstype 3D test chart, set n as a parameter which represents a quantity ofthe test chart layers, set t as a parameter which represents an errortolerance of the photographic arrangement, set s as a parameter whichrepresents a quantity of moving steps of the photographic arrangement,and then a functional equation regarding the quantity of the testpattern payers is as follows: n=f(t, a, s).

According to an embodiment of the present invention, in the above crosstype 3D test chart, set d as a parameter which represents a layout ofthe cross type test patterns, wherein d_(ij) is a parameter whichrepresents a distance from one of the cross type test pattern of thecorresponding test chart layer to a center of the test chart layer, setF as a parameter which represents a testing field of view of thephotographic arrangement, wherein a functional equation regarding thelayout of the test patterns is as follows: d_(ij)=f′(F, h_(ij), EFL).

According to an embodiment of the present invention, in the above crosstype 3D test chart, set L as a parameter which represents a size of eachcross type test pattern and L_(ij) is a parameter representing a size ofith test pattern of jth test chart layer, set t′ as a parameter whichrepresents an error tolerance for manufacturing the 3D test char, set n′as the parameter which represents an index of refraction of the 3D testchart, set s′ as a parameter which represents an allowable disc ofconfusion during a calculating step of a software, set ΔF as a parameterwhich represents an allowable range of a span of testing field of view,and a functional equation regarding the size of the test pattern is asfollows: L_(ij)=f(dij, ΔF, t′, n′, s′).

According to an embodiment of the present invention, in the above crosstype 3D test chart, sizes of the cross type test patterns of each of thetest chart layer are the same or different.

According to an embodiment of the present invention, in the above crosstype 3D test chart, each of the carrier layers is made of materialselected from the group consisting of organic glass, inorganic glass,and transparent display screen.

According to another aspect of the present invention, the presentinvention further provides a method of testing a photographicarrangement comprising a photographic module and an image sensor,comprising the following steps: (i) configuring a plurality of testpatterns in a direction along a depth thereof to provide a plurality ofscenes of different depths; (ii) capturing an image information of theplurality of test patterns though shooting the 3D test chart by thephotographic arrangement; and (iii) based on the image information,obtaining a focal position of the photographic module, and a tilt vectorof the photographic module and the image sensor, and determining arelative position of the photographic module and the image sensor.

According to an embodiment of the present invention, in the abovetesting method, the step (i) further comprises a step of providing a 3Dtest chart comprising a plurality of test chart layers which arearranged in the direction along the depth of the 3D test chart, whereineach of the test chart layers is provided with at least one the testpattern, wherein the test patterns do not overlap with each other.

According to an embodiment of the present invention, in the abovetesting method, the step (i) further comprises a step of collecting aplurality of parameters of a photographic arrangement to be tested, anddetermining a position configuration of the 3D test chart; and based ona precision requirement of the photographic arrangement, determining aquantity of test chart layers, and configuring a layout of test patternsof the test chart layers.

According to an embodiment of the present invention, in the abovetesting method, the step (i) further comprises a step of determining asize of each of the test patterns.

According to an embodiment of the present invention, in the abovetesting method, further comprising the steps of setting a as a parameterwhich represents a precision requirement for fitting a back focus of thephotographic arrangement to be tested, setting EFL as a parameter whichrepresents a focal length, setting h as a parameter which represent aposition configuration of the 3D test chart, wherein h_(j) represents aposition of jth layer of the test chart layers, and obtaining afunctional equation regarding a position configuration of the test chartlayers as follows: a=−((EFL*(−hj)/(EFL−hj)−(EFL*(−h)/(EFL−h))).

According to an embodiment of the present invention, in the abovetesting method, further comprising the steps of setting n as a parameterwhich represents a quantity of the test chart layers, setting t as aparameter which represents an error tolerance of the photographicarrangement, setting s as a parameter which represents a quantity ofmoving steps of the photographic arrangement, and obtaining a functionalequation regarding the quantity of the test pattern payers as follows:n=f(t, a, s), wherein the step (A) further comprising the steps ofsetting d as a parameter which represents a layout of the test patterns,wherein d_(ij) is a parameter which represents a distance from one ofthe test pattern of the corresponding test chart layer to a center ofthe test chart layer, setting F as a parameter which represents atesting field of view of the photographic arrangement, and obtaining afunctional equation regarding the layout of the test patterns asfollows: d_(ij)=f(F, h_(ij), EFL).

According to an embodiment of the present invention, in the abovetesting method, further comprising the steps of setting L as a parameterwhich represents a size of each test pattern and L_(ij) is a parameterrepresenting a size of ith test pattern of jth test chart layer, settingt′ as a parameter which represents an error tolerance for manufacturingthe 3D test char, setting n′ as the parameter which represents an indexof refraction of the 3D test chart, setting s′ as a parameter whichrepresents an allowable disc of confusion during a calculating step of asoftware, setting ΔF as a parameter which represents an allowable rangeof a span of testing field of view, and obtaining a functional equationregarding the size of the test pattern as follows: L_(ij)=f(dij, ΔF, t′,n′, s′).

According to an embodiment of the present invention, in the abovetesting method, further comprising the steps of setting mtf_((ij)) as aparameter representing a resolution value of each of the test patterns,setting ω as a parameter representing a shape of each of the testpatterns, setting (h,d) as a parameter representing a positionconfiguration of each of the test patterns, setting s as a parameterrepresenting an intensity of a light source, and then obtaining afunctional equation regarding the resolution value of each of the testpatterns as follows: mtf_((ij))=f(ω, h, d, s).

According to an embodiment of the present invention, in the abovetesting method, a functional equation regarding a relationship betweenan imaging resolution and a defocus amount of each of the test patternsis as follows:F ₀ =F _((v)) {mtf ₍₀₁₎ , mtf ₍₀₂₎ , mtf ₍₀₃₎ . . . tmf _((0j))},F _(j) =F _((v)) {mtf _((i1)) , mtf _((i2)) , mtf _((i3)) . . . mtf_((ij))}.

According to an embodiment of the present invention, in the abovetesting method, a method for evaluating an imaging quality of thephotographic arrangement is a method selected from the group consistingof OTF, MTF, SFR, CTF, TV line and the combination thereof.

According to an embodiment of the present invention, in the abovetesting method, a shape of the test pattern is selected from the groupconsisting of a square shape, a triangular shape, a circular shape, anoval shape, a cross shape, a shape of a pair of black and white lines, astar shape and the combination thereof.

According to an embodiment of the present invention, in the abovetesting method, the 3D test chart is formed as a chart selected from thegroup consisting of a transmissive test chart, a reflective test chart,a projection test chart, and a focus zooming and imaging type testchart.

According to another aspect of the present invention, the presentinvention further provides a method of adjusting a photographicarrangement, comprising the steps of: (α) capturing information ofscenes of different depths of a 3D test chart, determining a relativeposition of a photographic module and an image sensor of thephotographic arrangement, and obtaining related data corresponding tothe relative position; and (β) based on the related data, accomplishingan adjusting process of the photographic module and the image sensor.

According to an embodiment of the present invention, in the aboveadjusting method, the step (α) further comprises a step of calculatingout a focal point of the photographic module, a tilt vector and a shiftvector of the photographic module and the image sensor through afunctional equation based on the image information.

According to an embodiment of the present invention, in the aboveadjusting method, further comprising the steps of setting mtf_((ij)) asa parameter representing a resolution value of each of the testpatterns, setting ω as a parameter representing a shape of each of thetest patterns, setting (h,d) as a parameter representing a positionconfiguration of each of the test patterns, setting s as a parameterrepresenting an intensity of a light source, and then obtaining afunctional equation regarding the resolution value of each of the testpatterns as follows: mtf_((ij))=f(ω, h, d, s).

According to an embodiment of the present invention, in the aboveadjusting method, a functional equation regarding a relationship betweenan imaging resolution and a defocus amount of each of the test patternsis as follows:F ₀ =F _((v)) {mtf ₍₀₁₎ , mtf ₍₀₂₎ , mtf ₍₀₃₎ . . . tmf _((0j))},F _(j) =F _((v)) {mtf _((i1)) , mtf _((i2)) , mtf _((i3)) . . . tmf_((ij))}.

According to an embodiment of the present invention, in the aboveadjusting method, the step (α) further comprises the steps of: (α.1)configuring a plurality of test patterns in a direction along a depththereof to provide the plurality of scenes of different depths; (α.2)capturing the image information of the plurality of test patterns thoughshooting the 3D test chart by the photographic arrangement; and (α.3)based on the image information, obtaining a focal position of thephotographic module, and a tilt vector and a shift vector of thephotographic module and the image sensor, and determining a relativeposition of the photographic module and the image sensor.

According to another aspect of the present invention, the presentinvention further provides an adjusting arrangement for adjusting aphotographic arrangement, comprising: a 3D test chart comprising aplurality of test patterns which are arranged in a direction along adepth thereof, wherein the test patterns do not overlap with each other,wherein two adjacent the test patterns are spacedly aligned with eachother, wherein the photographic arrangement is arranged to shoot the 3Dtest chart to obtain an image containing information of scenes ofdifferent depths provided by the test patterns; and an adjusting unitfor accomplishing an adjusting process of the photographic arrangementbased on data provided by the information of scenes of different depths.

According to an embodiment of the present invention, in the aboveadjusting arrangement, further comprising a plurality of test chartlayers each is provided with at least one the test pattern, wherein eachof the test pattern of one of the test chart layers does not overlapwith other the test patterns of other the test chart layers.

According to an embodiment of the present invention, in the aboveadjusting arrangement, a shape of the test pattern is selected from thegroup consisting of a square shape, a triangular shape, a circularshape, an oval shape, a cross shape, a shape of a pair of black andwhite lines, a star shape and the combination thereof.

According to an embodiment of the present invention, in the aboveadjusting arrangement, the 3D test chart is formed as a chart selectedfrom the group consisting of a transmissive test chart, a reflectivetest chart, a projection test chart, and a focus zooming and imagingtype test chart.

According to an embodiment of the present invention, in the aboveadjusting arrangement, further comprising a light source, wherein thelight source and the photographic arrangement are respectively providedat two opposite sides of the 3D test chart.

According to an embodiment of the present invention, in the aboveadjusting arrangement, further comprising a light source, wherein thelight source and the photographic arrangement are provided at a sameside of the 3D test chart.

Still further objects and advantages will become apparent from aconsideration of the ensuing description and drawings.

These and other objectives, features, and advantages of the presentinvention will become apparent from the following detailed description,the accompanying drawings, and the appended claims.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic view illustrating the relationship between thephotographic module and the image sensor of a photographic arrangement.

FIG. 2 is a flow chart illustrating a process for designing theparameters of the 3D test chart of the present invention.

FIG. 3 is a schematic view illustrating a layout of the test patterns ofthe test chart layers of the 3D test chart of the present invention.

FIGS. 4, 5 and 6 are schematic views illustrating the 3D test chartaccording to a first preferred embodiment of the present invention.

FIGS. 7, 8, 9 and 10 are schematic views illustrating the 3D test chartaccording to a second preferred embodiment of the present invention.

FIGS. 11, 12, 13 and 14 are schematic views illustrating the 3D testchart according to a third preferred embodiment of the presentinvention.

FIGS. 15, 16, and 17 are schematic views illustrating the 3D test chartaccording to a fourth preferred embodiment of the present invention.

FIG. 18 is a flow chart illustrating the process for designing the 3Dtest chart which is embodied as a cross type 3D test chart of thepresent invention.

FIG. 19 is a side view of the 3D test chart of the present invention.

FIG. 20 is a schematic view illustrating the relationship between theimage view span and image resolution of the photographic arrangement ofthe present invention.

FIG. 21 is a schematic view illustrating the suitable shapes of the testpatterns of the present invention.

FIG. 22 is a schematic view illustrating the layout of the cross typetest patterns of the test chart layers according to the above preferredembodiment of the present invention.

FIG. 23 is a schematic view illustrating a first example of the crosstype 3D test chart according to the above preferred embodiment of thepresent invention.

FIG. 24 is a schematic view illustrating a second example of the crosstype 3D test chart according to the above preferred embodiment of thepresent invention.

FIG. 25 is a schematic view illustrating the image pattern formed in theimage space which is projected by the second example of the cross type3D test chart which is in the object space according to the abovepreferred embodiment of the present invention.

FIG. 26 is a schematic view illustrating a third example of the crosstype 3D test chart according to the above preferred embodiment of thepresent invention.

FIG. 27 is a schematic view illustrating a fourth example of the crosstype 3D test chart according to the above preferred embodiment of thepresent invention.

FIG. 28 is a flow chart illustrating a testing and adjusting process ofthe photographic arrangement of the present invention.

FIG. 29 is a schematic view illustrating the layout of the 3D test chartof the present invention.

FIG. 30 is a diagram illustrating the relationship between the imageresolution and image distance of test patterns at different positionsbefore the adjusting process of the photographic arrangement of thepresent invention.

FIG. 31 is a diagram illustrating the images of the test patterns atdifferent positions before the adjusting process of the photographicarrangement of the present invention.

FIG. 32 is a diagram illustrating the relationship between the imageresolution and image distance of test patterns at different positionsafter the adjusting process of the photographic arrangement of thepresent invention.

FIG. 33 is a diagram illustrating the images of the test patterns atdifferent positions after the adjusting process of the photographicarrangement of the present invention.

FIG. 34 is a schematic view illustrating the adjusting process of thephotographic arrangement using the 3D test chart of the presentinvention.

FIG. 35 is a diagram illustrating the relationship between the depth offield and the focal length of the photographic arrangement of thepresent invention.

FIG. 36 is a block diagram illustrating the adjusting arrangement of thepresent invention.

FIG. 37 is a flow chart illustrating the design of the 3D test chart ofthe present invention.

FIG. 38 is a flow chart illustrating the formation of the 3D test chartof the present invention.

FIG. 39 is a flow chart illustrating the testing process of the presentinvention.

FIG. 40 is a flow chart illustrating the adjusting process of thepresent invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT

The following description is disclosed to enable any person skilled inthe art to make and use the present invention. Preferred embodiments areprovided in the following description only as examples and modificationswill be apparent to those skilled in the art. The general principlesdefined in the following description would be applied to otherembodiments, alternatives, modifications, equivalents, and applicationswithout departing from the spirit and scope of the present invention.

The present invention provides a 3D test chart 100 which is arranged fortesting a photographic arrangement 10. The photographic arrangement 10comprises a photographic module 11, an image sensor 12 and otherpossible components such as a holder. Accordingly, the photographicmodule 11 and the image sensor 12 are packaged and assembled to form thephotographic arrangement 10. When packing the photographic module 11with the image sensor 12, because the tilt of the image plane of thephotographic module 11, as well as the tilt error of other components ofthe photographic arrangement 10 and the limit of the accuracy of thepackaging procedure, it is required to test the focal length of thephotographic arrangement 10 and the tilt of the image plane of thephotographic module 11 and the image sensor 12, so as to obtain relateddata for adjusting the relative position of the photographic module 11and the image sensor 12 based on the data, so that the imaging qualityof the photographic arrangement 10 is ensured after the packagingprocedure. FIG. 1 illustrates a situation when the photographic module11 and the image sensor 12 are not correctly aligned with each otherbefore an adjusting process, because a tilt exists between thephotographic module 11 and the image sensor 12, i.g. an optical axis ofthe photographic module 11 is not vertical to a light receiving surfaceof the image sensor 12, and is not aligned with an optical axis of theimage sensor 12, causing the light beams reflected from an object andcaptured by the photographic module 11 being not able to evenly receivedby the image sensor 12, and resulting in the blurring of the imagesprovided by the photographic arrangement 10. The person of ordinaryskilled in the art should be understand that besides the mismatch of thephotographic module 11 and the image sensor 12 as an example shown inFIG. 1, there are other errors such as the image inclination of thephotographic module 11 itself.

Referring to FIGS. 3 to 16 of the drawings, the 3D test chart 100 of thepresent invention comprises a plurality of test chart layers 20 eachcomprising at least one test pattern 21, so that the plurality of testpatterns 21 provides scene information of different depths. When testingthe photographic arrangement 10, the photographic module 11 captureslight beams carried with information of each of the test patterns alongvarious different depths, and then the light beams are received by theimage sensor 12 and undergoes a photoelectric transformation process,and data information reflecting the tilt of the photographic module 11and the image sensor 12 is obtained for facilitating the subsequentadjusting process of the photographic module 11 and the image sensor 12.

It is worth mentioning that the parameters of the 3D test chart 100 canbe determined according to the type of the photographic arrangement 10,these parameters of the 3D test chart 100 can be the number of the testchart layers 20, the distance between adjacent test chart layers 20, theposition of the 3D test chart 100, or the shape, size, position, and thedensity of each test pattern 21.

FIG. 2 is a flow chart illustrating the designing of the 3D test chart100. More specifically, when the type of the photographic arrangement 10to be tested is determined, some testing parameters of the photographicarrangement 10, such as the testing field of view, the focal length, thetesting distance, and the precision requirement for fitting the backfocus, should be measured. In order to facilitate the description of therelationship between the parameters of the 3D test chart 100 of thephotographic arrangement 10, set F as the parameter which represents thetesting field of view, set EFL as the parameter which represents thefocal length of the photographic arrangement 10, and set a as theparameter which represents the precision requirement for fitting theback focus of the photographic arrangement 10. Accordingly, theparameter a reflecting the precision requirement for fitting the backfocus is determined by the actual fitting requirement which depends onthe processing requirement of the software. Furthermore, set Z as theparameter which represents the testing distance of the 3D test chart100, and Z_(j) represents the testing distance of the jth layer of thetest chart layers 20, the range of the values of j is that j>=2, whileZ₁ represents the testing distance of the first layer of the test chartlayers 20 which is the test patter layer 20 of the 3D test chartfarthest from the photographic module 11, meanwhile, Z₁ is determinedwhen the type of the photographic arrangement 10 is selected. In otherwords, when the type of the photographic arrangement 10 to be tested isdetermined, the testing distance of the first layer of the test chartlayers 20 is determined at the same time. Furthermore, when the relatedparameters of the photographic arrangement 10 are obtained, theparameters are used to calculate the position of the 3D test chart andthe number of the layers of the test chart layers 20. More specifically,set h as the parameter which represent the position of the 3D test chart100, then h_(j) represents the position of the jth layer of the testchart layers 20, and similarly the range of the values of j is thatj>=2, the functional equation reflecting the position of the test chartlayers is that a=−((EFL*(−hj)/(EFL−j)−(EFL*(−h)/(EFL−h))). Accordingly,based on the above functional equation, the value of h_(j) can becalculated to determine the position of each test chart layer 20 of the3D test chart 100.

Furthermore, set n as the parameter which represents the number of thelayers of the test chart layers 20, set t as the parameter whichrepresents the error tolerance of the photographic arrangement 10 whichis predetermined by the manufacturing process, accordingly, theparameter t contains but not limited to error tolerances of the height,the tilt, and the shift of the photographic arrangement 10. In addition,set s as the parameter which represents the number of the moving stepsof the photographic arrangement 10. It is worth mentioning that in someexamples, the range of the values of the number of the moving steps ofthe photographic arrangement 10 can be that s>=1. In other words, onlyone single moving step may be required to move the photographicarrangement 10 for obtaining the corresponding data. Accordingly, thefunctional equation regarding the number of the layers of the testpattern payers 20 can be as follows: n=f(t, a, s). Thus, the value ofthe parameter of n can be calculated based on the above formula tocalculate the number of the required test chart layers 20. In addition,in other possible examples, the photographic arrangement 10 may notrequire moving before obtaining the data.

Accordingly, after determining the position of the 3D test chart and thenumber of the layers of the test chart layers, the shape, position andsize of each test pattern 21 can be determined in the following step.According to an example of the present invention, the shape of each testpattern 21 is not limited and may be embodied as a shape selected fromthe group consisting of a square shape, a triangular shape, a circularshape, an oval shape, a cross shape, a shape of a pair of black andwhite lines, a star shape and the combination thereof. It is worthmentioning that the shape of each test pattern can be any graph whichcan be used to calculate the imaging quality of the photographicarrangement 10, including any tangible icons and icons with colordifference.

As an example, referring to FIG. 3 of the drawings, set d as theparameter which represents the layout of the test patterns 21 of the 3Dtest chart 100. More specifically, the parameter d of the test patterns21 represents the density of the test patterns 21. Accordingly, setd_(ij) as a parameter which represents a distance from a test pattern 21of a test chart layer 20 to a center of the test chart layer 20, whereini represents the position of the test pattern 21 which is located at thetest chart layer 20, j represents the number of the test chart layer, sothat d_(ij) represents the layout of the ith test pattern 21 of the jthtest chart layer 20, and the functional equation representing the layoutof the test patterns is as follows: d_(ij)=f′(F, h_(ij), EFL). It isworth mentioning that the testing field of view F is determined by thephotographic arrangement 10 to be tested, h_(ij) can be obtained by theabove functional equation reflecting the position configuration of the3D test chart. Therefore, the above functional formula can be used tocalculate the value of d_(ij), and thus the layout of the test patterns21 can be determined. In other words, the density of the test patterns21 of each test chart layer 20 can be obtained based on the abovefunctional formula. It is worth mentioning that the density of the testpatterns 21 of the test chart layers 20 can be the same, or also can bedifferent.

Furthermore, referring to FIG. 3 of the drawings, set L as the parameterwhich represents the size of each test pattern 21. Accordingly, L_(ij)can be the parameter which represents the size of one of the testpatterns 21, i.e. L_(ij) is the parameter representing the size of theith test pattern 21 of the jth test chart layer 20. Accordingly, d_(ij)is the parameter which represents the distance from a test pattern 21 ofa test chart layer 20 to a center of the test chart layer 20.Furthermore, set ΔF as the parameter which represents the allowablerange of the span of testing field of view, set t′ as the parameterwhich represents the error tolerance for manufacturing the 3D test chart100, set n′ as the parameter which represents the index of refraction ofthe 3D test chart 100, set s′ as the parameter which represents theallowable disc of confusion during a calculating step of a software, anda functional equation regarding the size of the test pattern 21 is asfollows: L_(ij)=f″(dij, ΔF, t′, n′, s′). Accordingly, the size of eachtest pattern 21 can be obtained by calculating the value of L_(ij) basedon the above mentioned functional equation.

It is worth mentioning that the process for calculating the size L_(ij)of the test pattern 21 is a procedure for balancing each parameter ofthe 3D test chart with the error tolerance for manufacturing the 3D testchart 100, and when the size L_(ij) of the test pattern 21 isdetermined, the error tolerance for manufacturing the 3D test chart 100is determined. It is still worth mentioning that when the parameters ofthe 3D test chart are determined, the 3D test chart can be manufacturedbased on these parameters.

Accordingly, referring to FIG. 37, the present invention provides amethod for manufacturing the 3D test chart, wherein the method comprisesthe following steps.

(A) Collect the parameters of the photographic arrangement 10 to betested, and determine the position of the 3D test chart 100.

(B) Determine the number of the layers of the test chart layers of the3D test chart, and design the layout of the test patterns of the testchart layers according to the precision requirement of the photographicarrangement 10.

More specifically, in the step (A), when the type of the photographicarrangement 10 to be tested is determined, the parameters of thephotographic arrangement 10, which including the test field of view, thefocal length, and the precision requirement for fitting the back focus,are required to be collected. The person of ordinary skilled in the artshould understand that other parameters of the photographic arrangement10 to be tested can be collected according to different requirements, sothat more parameters of the photographic arrangement 10 are obtained tooptimize the design of the 3D test chart 100.

Furthermore, in the step (B), the method further comprises a step ofdetermining the size of each test pattern 21.

Preferably, in the step (A), set a as the parameter which represents theprecision requirement for fitting the back focus of the photographicarrangement 10 to be tested, set EFL as the parameter which representsthe focal length, set h as the parameter which represent the position ofthe 3D test chart 100, then h_(j) represents the position of the jthlayer of the test chart layers 20, and the functional equationreflecting the position of the test chart layers is as follows:a=−((EFL*(−hj)/(EFL−hj)−(EFL*(−h)/(EFL−h))). Accordingly, based on theabove functional equation, the value of h_(j) can be calculated todetermine the position of each test chart layer 20 of the 3D test chart100.

Preferably, in the step (A), set n as the parameter which represents thenumber of the layers of the test chart layers 20, set t as the parameterwhich represents the error tolerance of the photographic arrangement 10which is predetermined by the manufacturing process, set s as theparameter which represents the number of the moving steps of thephotographic arrangement 10, and then obtain the functional equationregarding the number of the layers of the test pattern payers 20 asfollows: n=f(t, a, s). In addition, set d as the parameter whichrepresents the layout of the test patterns 21 of the 3D test chart 100,and d_(ij) is a parameter which represents a distance from a testpattern 21 of a test chart layer 20 to a center of the test chart layer20, set F as the parameter which represents the testing field of view ofthe photographic arrangement 10, and obtain the functional equationrepresenting the layout of the test patterns as follows: d_(ij)=f′(F,h_(ij), EFL). Thus, the value of the parameters of n and d_(ij) can berespectively calculated based on the above formulas to calculate thenumber of the required test chart layers 20 and the layout of the testpatterns 21.

Preferably, set L as the parameter which represents the size of eachtest pattern 21 and L_(ij) can be the parameter representing the size ofthe ith test pattern 21 of the jth test chart layer 20, set t′ as theparameter which represents the error tolerance for manufacturing the 3Dtest chart 100, set n′ as the parameter which represents the index ofrefraction of the 3D test chart 100, set s′ as the parameter whichrepresents the allowable disc of confusion during a calculating step ofa software, set ΔF as the parameter which represents the allowable rangeof the span of testing field of view, and then obtain a functionalequation regarding the size of the test pattern 21 as follows:L_(ij)=f″(dij, ΔF, t′, n′, s′). Accordingly, the size of each testpattern 21 can be obtained by calculating the value of L_(ij) based onthe above functional equation.

Accordingly, each test pattern 21 of one of the test chart layers 20does not overlap with test patterns 21 of other test chart layers 20along the direction of the depth thereof, so that when the photographicmodule 11 captures information of each test pattern 21, the testpatterns 21 adjacent to the photographic module 11 will not block thelight beams reflected or transmitted through the test patterns which arerelatively far from the photographic module 11. As an example, accordingto an embodiment of the present invention, each test pattern 21 of eachtest chart layer 20 is configured to have an upset trapezoid shape. Inother words, the distance from the test pattern 21 to the center of thecorresponding test chart layer 20 is gradually decreased from the testpatterns 21 far away from the photographic module 11 to the testpatterns 21 adjacent to the photographic module 11, as shown in FIG. 4of the drawings, and thus the information of each test pattern 21 ofeach test chart layer 20 can be captured by the photographic module 11,so as to provide an image with depth information.

In other words, the 3D test chart 100 has a plurality of test patterns21 along the depth thereof which are not overlapping with each other,and two adjacent test patterns 21 are spacedly arranged to form the 3Dtest chart 100. Accordingly, as an example, each test chart layer 21 isembodied to have a carrier for carrying the test patterns 21. As anotherexample, each test pattern 21 may be formed by a projection method.

Referring to FIGS. 4, 5 and 6 of the drawings, a 3D test chart and itsapplication according to a first preferred embodiment of the presentinvention is illustrated. The 3D test chart 100 comprises a plurality oftest chart layers 20 which are arranged in a direction along a depththereof, each test chart layer 20 is provided with at least one testpattern 21, and the test pattern 21 of any test chart layer 20 does notoverlap with test patterns 21 of other test chart layers 20 in thedirection along the depth thereof. In addition, each test pattern 21 isdistinguishable from the corresponding test chart layer 20, so that eachtest pattern 21 can be easily identified and captured by thephotographic module 11. For example, a color contrast is producedbetween each test pattern 21 and the corresponding test chart layer 20.

Preferably, each test chart layer 20 can be made of transparentmaterial, so as to reduce the index of the refraction of each test chartlayer 20 as much as possible, and each test pattern 21 of thecorresponding test chart layer 20 can be identified and captured by thephotographic module 11. In other words, light beams carrying informationof one test pattern 21 can pass through other test chart layers 20without being blocked, so as to be captured by the photographic module11, so that the photographic arrangement 10 can obtain image of the 3Dtest chart with information of scenes of different depths.

Referring to FIG. 4 of the drawings, the 3D test chart 100 may beembodied as a transmissive 3D test chart for testing the photographicarrangement 10. More specifically, a light source 40 is aligned with the3D test chart 100 in such a manner that the 3D test chart 100 is at aposition between the light source 40 and the photographic arrangement 10when the photographic arrangement 10 is being tested, so that the lightbeams of the light source 40 pass through the test chart layers 20 andenhance the contrast between the test pattern 21 and the correspondingtest chart layer 20, so that each test pattern 21 can be easilyidentified and captured by the photographic module 11.

FIGS. 5 and 6 are respectively top view and side view of the 3D testchart 100, a person of ordinary skilled in the art can easily understandthe configuration of the test patterns 21 of the test chart layers 20.

Accordingly, during the testing process, the light source 40 producesevenly projected light beams which pass through each test chart layer 20for enhancing the contrast between the test pattern 21 and thecorresponding test chart layer 20. It is worth mentioning that all ofthe light beams passing through the test chart layers with the sameperformance for enhancing the contrast between the test pattern 21 andthe corresponding test chart layer 20, so that when the photographicmodule 11 receives the light beams, the light beams carrying with theinformation of the test patterns can be received by the image sensor 12and then undergo a photoelectric transformation process.

Accordingly, FIGS. 7 to 10 illustrate a 3D test chart 100 and itsapplication according to a second preferred embodiment of the presentinvention. The 3D test chart 100 comprises a plurality of test chartlayers 20A which are arranged in a direction along a depth thereof, eachtest chart layer 20A is provided with at least one test pattern 21A, andthe test pattern 21A of any test chart layer 20A does not overlap withtest patterns 21A of other test chart layers 20A in the direction alongthe depth thereof. In addition, each test pattern 21A is distinguishablefrom the corresponding test chart layer 20A, so that each test pattern21A can be easily identified and captured by the photographic module11A. For example, a color contrast is produced between each test pattern21A and the corresponding test chart layer 20A.

Furthermore, referring to FIG. 7 of the drawings, the 3D test chart 100is a reflective 3D test chart for testing the photographic arrangement10. More specifically, a light source 40A is provided and the 3D testchart 100 is provided at a position aligning with the light source 40Afor reflecting the light beams of the light source 40A. For instance,two or more light sources 40A may be provided and light beams can evenlypass through the test chart layers 20 and reflected by the test patterns21. As shown in the drawings of this embodiment, when testing thephotographic arrangement 10, the 3D test chart 100 of this embodiment isshown be provided above the light sources 40A and the photographicarrangement 10, the light sources 40A may be provided around thephotographic module 11. It is worth mentioning that the person ofordinary skilled in the art shall understand that the distance andlocation relationship between the light sources 40A, the photographicmodule 11, and the 3D test chart 100 can be adjusted according to actualrequirements. For example, the light sources 40A and the photographicmodule 11 may be arranged at a lateral side of the 3D test chart 100.

Accordingly, the light beams produced by the light sources 40A areevenly projected, and then pass through the test chart layer 20A andproduce the contrast between each test pattern 21A and the correspondingtest chart layer 20A, so that each test pattern 21A can be easilyidentified and captured by the photographic module 11.

FIGS. 9 and 10 are respectively top view and side view of the 3D testchart 100, a person of ordinary skilled in the art can easily understandthe configuration of the test patterns 21A of the test chart layers 20Aof this embodiment.

It is worth mentioning that the difference between the second embodimentshown in FIG. 7 and the first embodiment shown in FIG. 4 is that lightbeams of the light source 40 penetrate through the 3D test chart andthen are captured by the photographic module 11, while the light beamsof the light sources 40A projecting towards the 3D test chart 100 arereflected by the test patterns 21A so as to produce the contrast betweeneach test pattern 21A and the corresponding test chart layer 20A.

According to an embodiment of the present invention, each test chartlayer 20A may be made of tangible material, or can be formed by aprojection method. According to the example shown in FIG. 10, test chartlayers 20A of the 3D test chart 100 are embodied to be formed by aplurality of carrier carriers 30A which are overlappedly and spacedlyaligned with each other. Accordingly, the distance between adjacentcarrier layers 30A determines the distance between adjacent test chartlayers 20A, the material and the thickness of each carrier member 30Adirectly have influence on the index of refraction of the 3D test chart100A. Therefore, the influence of the index of refraction of the 3D testchart 100A acting on the performance should be considered when selectingthe material and thickness of each carrier layer 30A. It is still worthmentioning that each carrier layer 30A can be made of transparentmaterial, so that the 3D test chart can be embodied either as atransmissive test chart 100 or a reflective test chart 100A, and eachtest pattern 21A of the corresponding test chart layer 20A can beidentified and captured by the photographic module 11, so as to ensurethe accuracy of the testing result.

Furthermore, each test pattern 21A can be provided or formed at eachcarrier layer 30A, so as to form a plurality of test patterns 21A whichdoes not overlap with each other in the direction along the depththereof. More specifically, as an example, the test pattern 21A can beprovided at at least one predetermined area of each carrier layer 30A,and the quantity, size and shape of the predetermined area can beobtained based on the functional equation regarding the test patterns21A, so that each test pattern 21A is distinguishable from thecorresponding carrier layer 30A, so that it is convenient for thephotographic module 11 to identify and capture the information of thetest patterns 21A.

According to another example of the present invention, the predeterminedarea of the carrier layer 30A can be selected, and then some chemical orphysical treating process is introduced to make the predetermined areadistinguishable from other areas, so as to form the test patterns 21A.It is appreciated that other possible method can be employed to form thetest patterns 21A at the test chart layers 20A formed by the carrierlayers 30A.

Accordingly, as shown in FIG. 38, the present invention further providesa method for forming the 3D test chart 100A of the present invention,wherein the method comprises the following steps.

(a) Determine a predetermined area of a test chart layer 20A, andprovide at least one test pattern 21A at the predetermined area.

(b) Overlappedly align a plurality of test chart layers 20A in such amanner that each test pattern 21A of each test chart layer 20A does notoverlap with other test patterns 21A of other test chart layers 20A, soas to form the 3D test chart.

Preferably, in the step (b), light beams passing through each test chartlayer 20A enhance the contrast between each test pattern 21A and thecorresponding test chart layer 20A.

Preferably, in the above method, the 3D test chart 100A may be providedbetween the light source 40A and the photographic arrangement 10, andlight beams of the light sources 40A pass through the test chart layers20A before reaching to the photographic arrangement 10.

Preferably, in the above method, one or more light sources 40A can bearranged with the photographic arrangement 10 at the same side of the 3Dtest chart 100A, so that light beams can be reflected by the testpatterns 21A.

It is worth mentioning that light beams are evenly distributed to thetest chart layers 20A, and it is even worth mentioning that thequantity, size and shape of the predetermine area can be obtained bycalculating the functional equation regarding the test patterns 21A.

Referring to FIGS. 11 to 14 of the drawings, this embodiment uses aprojection method to form the 3D test chart 100. In comparison with theembodiments illustrated in FIGS. 4 to 7 of the drawings, the 3D testchart of this embodiment does not require the carrier layers 30A forcarrying the test patterns 21.

As a detailed example, referring to FIG. 11 of the drawings, the 3D testchart 100B comprises a light source 40B and a projection source 50Bwhich is provided at a light path of the light source 40B. In otherwords, the light beams reach to the projection source 50B and thenproject out to form scenes of different depths in a predetermined spacefor facilitating the subsequent testing process of the photographicarrangement 10B.

Accordingly, the present invention provides a method for forming the 3Dtest chart 100B, wherein the method comprises a step of providing theprojection source 50B in the light path of the light beams of the lightsource 40B, and forming a plurality of test patterns 21B which do notoverlap with each other by the light beams of the light source 40Bacting on the projection source 50B. Accordingly, two adjacent testpatterns 21B are spacedly arranged with other to from the 3D test chart.Referring to FIG. 12 of the drawings, the light source 40B and theprojection source 50B can be provided at a lateral side of thepredetermined space, and the projection source 50B can be provided at aposition between the light source 40B and the predetermined space, sothat the light beams produced by the light source 40B can project theinformation of the projection source 50B to the predetermined space forforming the plurality of test patterns 21B of the 3D test chart 100B.

In this embodiment, when employing the testing device to test thephotographic arrangement 10, each test pattern 21B of the 3D test chart100B is formed in the predetermined space while air may serve as amedia, so that the influence of the index of the refraction on thetesting result is reduced as much as possible, so as to ensure thetesting precision. In addition, the 3D test chart 100B formed by theprojection method is still advantageous that the volume of the 3D testchart 100B can be further reduced.

FIGS. 13 and 14 are respectively top view and side view of the 3D testchart 100B of this preferred embodiment, a person of ordinary skilled inthe art can easily understand the configuration of the test patterns 21Bof this embodiment.

FIGS. 15, 16 and 17 are schematic views illustrating the testing processof the photographic arrangement 10 employing a focus zooming method.Similarly, the 3D test chart 100C comprises a light source 40C and aprojection source 50C which is provided at a light path of the lightsource 40C. In other words, the light beams reach to the projectionsource 50C and then project out to form scenes of different depths in apredetermined space for facilitating the subsequent testing process ofthe photographic arrangement 10C.

As an example, referring to FIG. 15 of the drawings, the light source40C and the projection source 50C are provided above the reserved spacefor forming the 3D test chart 100C in such a manner that the projectionsource 50C is provided between the reserved space and the light source40C, so that the light beams of the light source 40C can project theinformation of the light source 50C to the reserved space to form theplurality of test patterns 21C of the 3D test chart 100C.

Furthermore, the projection source 50C comprises a planar test chart 51Cand a focus zooming lens set 52C. Accordingly, the planar test chart51C, which is provided between the light source 40C and the focuszooming lens set 52C, includes at least one test object 511C, so thatthe light beams of the light sources 40C reach to the test object 511Cand form the 3D test chart 100C by means of the focus zooming lens set52C. It is worth mentioning that the size, position and the quantity ofthe test object 511C can be adjusted according to different requirementsof the 3D test chart 100C.

FIGS. 16 and 17 are respectively top view and side view of the 3D testchart 100C of this preferred embodiment, a person of ordinary skilled inthe art can easily understand the configuration of the test patterns 21Cof this embodiment.

Referring to FIG. 18 of the drawings, a specific example of the 3D testchart 100D of the present invention is illustrated. Accordingly, thetest pattern 21D of the 3D test chart 100D is embodied as a cross typetest pattern 21D, so as to form a cross type 3D test chart. Morespecifically, the cross type 3D test chart comprises a plurality of testchart layers 30D arranged in a direction along a depth thereof. Eachtest chart layer 30D includes at least a predetermined area which isprovided with one or more cross type test pattern 21D, so that the 3Dtest chart 100D allows a better testing result for testing thephotographic arrangement 10.

Furthermore, the cross type test pattern 21D of each test chart layer20D does not overlap with test patterns 21D of other test chart layers20D in the direction along the depth thereof, so that when each crosstype test pattern 21D is projected to the image space to form an image,they will not interfere with each other in the image, so that thetesting precision of the photographic arrangement 10 is ensured becauseno noise is created when analyzing the imaging resolution of thephotographic arrangement based on the image.

Generally speaking, as shown in FIG. 20, the value of the imagingresolution decreases when the span of the testing field of view of thephotographic arrangement 10 increases. This characteristic of thephotographic arrangement requires that the sample range should be assmall as possible when analyzing the imaging resolution, so that thetesting precision can be controlled. However, the person of ordinaryskilled in the art should understand that although the above solutioncan bring down the error of the imaging resolution of the photographicarrangement 10 when the span of the testing field of view is relativelylarge, the possibility for the test patterns interfering with each otherin the image may increase, so that when designing each test pattern ofthe cross type 3D test chart, suitable test patterns should be selectedto decrease the risk of interfering of different patterns in the imageas well as the error resulting from the relatively large testing fieldof view at the same time.

As shown in FIG. 21 of the drawings, several possible patterns for thetest patterns are illustrated. The person of ordinary skilled in the artshould understand that the test patterns shown in the drawings areexemplary only and do not limit the present invention.

According to this preferred embodiment of the present invention, inorder to prevent the interfering issue and guarantee that the testpatterns 21D can occupy as many pixels as possible in the image, theshape of the test pattern 21D can be selected to cross type (i.g.“+”)test pattern 21D or “−” type test pattern 21D when the size of the testpattern is predetermined. In other words, in order to ensure the densityof the test patterns in the predetermined areas, the cross type or “−”type test patterns 21D will not interfere with each other when appearingin the image, so that it is possible for the subsequent analyzing stepof the imaging resolution of the photographic arrangement 10. Inaddition, the cross type or “−” type test patterns 21D allows the 3Dteat chart to configure more patterns in a limited area, so that thetypes of the combined patterns can be enriched.

In addition, the cross type or “−” type test patterns 21D can avoid thenoise when analyzing the imaging resolution of the photographicarrangement 10 with the 3D test chart. However, it is preferred toconfigure the test patterns to form shapes both in the meridian andsagittal directions in the image. In other words, when the 3D test chartis employed for analyzing the imaging resolution of the photographicarrangement 10, it is preferred that the projection shapes of the testpatterns appear in the image extend along both in meridian and sagittaldirections. Since the “−” type test patterns 21D only extend in onedirection, it is preferred to choose the cross type test patterns 21Dwhich may extend both in meridian and sagittal directions, so as to meetthe testing requirements of the photographic arrangement 10. Therefore,it is possible for configuring more cross type test patterns 21D in arelatively limited area, so that the image formed from shooting thecross type 3D test chart by the photographic arrangement 10 is able toprovide more information regarding the imaging resolution of thephotographic arrangement 10.

The following disclosure will describe the design and forming method ofthe cross type 3D test chart, so that the person of ordinary skilled inthe art can understand the present invention more clearly. It isappreciate that other details of the embodiment may be technical skillswell known in this field and may be omitted in the description of thepresent invention.

As an example, FIG. 18 illustrates a procedure for designing the crosstype test chart of the present invention. More specifically, theparameters regarding the position configuration of the cross type 3Dtest chart, the layout of the cross type test patterns 21D can bedetermined by the type of the photographic arrangement 10. In otherwords, when the type of the photographic arrangement 10 is determined,the related parameters of the photographic arrangement 10 can bemeasured to calculate the parameters of the cross type 3D test chart. Itis worth mentioning that the parameters of the photographic arrangementinclude but not limited to the testing field of view, the focal length,the testing distance, and the precision requirement for fitting the backfocus.

In the following description, the process for calculating the size andnumber of the layers of the cross type test chart layers after measuringthe parameters of the photographic arrangement 10 is illustrated indetails.

More specifically, set F as the parameter which represents the testingfield of view, set EFL as the parameter which represents the focallength of the photographic arrangement 10, and set a as the parameterwhich represents the precision requirement for fitting the back focus ofthe photographic arrangement 10. Accordingly, the parameter a reflectingthe precision requirement for fitting the back focus is determined bythe actual fitting requirement which depends on the processingrequirement of the software. Furthermore, set Z as the parameter whichrepresents the testing distance of the cross type 3D test chart 100D,and Z_(j) represents the testing distance of the jth layer of the testchart layers 20D, the range of the values of j is that j>=2, while Z₁represents the testing distance of the first layer of the test chartlayers 20D which is the test patter layer 20D of the 3D test chartfarthest from the photographic module 11, meanwhile, Z₁ is determinedwhen the type of the photographic arrangement 10 is selected. In otherwords, when the type of the photographic arrangement 10 to be tested isdetermined, the testing distance of the first layer of the test chartlayers 20 is determined at the same time. Furthermore, when the relatedparameters of the photographic arrangement 10 are obtained, theparameters are used to calculate the position of the cross type 3D testchart and the number of the layers of the test chart layers 20D.

More specifically, set h as the parameter which represent the positionof the cross type 3D test chart 100D, then h_(j) represents the positionof the jth layer of the test chart layers 20D, and similarly the rangeof the values of j is that j>=2, the functional equation reflecting theposition of the test chart layers is thata=−((EFL*(−hj)/(EFL−hj)−(EFL*(−h)/(EFL−h))).

Accordingly, based on the above functional equation, the value of h_(j)can be calculated to determine the position of each test chart layer 20Dof the 3D test chart 100D.

Furthermore, set n as the parameter which represents the number of thelayers of the test chart layers 20D, set t as the parameter whichrepresents the error tolerance of the photographic arrangement 10 whichis predetermined by the manufacturing process, accordingly, theparameter t contains but not limited to error tolerances of the height,the tilt, and the shift of the photographic arrangement 10. In addition,set s as the parameter which represents the number of the moving stepsof the photographic arrangement 10. It is worth mentioning that in someexamples, the range of the values of the number of the moving steps ofthe photographic arrangement 10 can be that s>=1. In other words, onlyone single moving step may be required to move the photographicarrangement 10 for obtaining the corresponding data. Accordingly, thefunctional equation regarding the number of the layers of the testpattern payers 20D can be as follows: n=f(t, a, s). Thus, the value ofthe parameter of n can be calculated based on the above formula tocalculate the number of the required test chart layers 20D. In addition,in other possible examples, the photographic arrangement 10 may notrequire moving before obtaining the data.

Accordingly, after determining the position of the cross type 3D testchart and the number of the layers of the test chart layers, the shape,position and size of each test pattern 21D can be determined in thefollowing step

As an example, referring to FIG. 22 of the drawings, set d as theparameter which represents the layout of the cross type test patterns21D of the cross type 3D test chart 100D. More specifically, theparameter d of the test patterns 21D represents the density of the testpatterns 21. Accordingly, set d_(ij) as a parameter which represents adistance from a cross type test pattern 21 of a test chart layer 20 to acenter of the test chart layer 20, wherein i represents the position ofthe cross type test pattern 21 which is located at the test chart layer20, j represents the number of the test chart layer, so that d_(ij)represents the layout of the ith cross type test pattern 21 of the jthtest chart layer 20, and the functional equation representing the layoutof the test patterns is as follows: d_(ij)=f′(F, h_(ij), EFL). It isworth mentioning that the testing field of view F is determined by thephotographic arrangement 10 to be tested, h_(ij) can be obtained by theabove functional equation reflecting the position configuration of the3D test chart. Therefore, the above functional formula can be used tocalculate the value of d_(ij), and thus the layout of the test patterns21 can be determined. In other words, the density of the test patterns21 of each test chart layer 20 can be obtained based on the abovefunctional formula. It is worth mentioning that the density of the crosstype test patterns 21D of the test chart layers 20D can be the same, oralso can be different.

Furthermore, referring to FIG. 22, set L as the parameter whichrepresents the size of each cross type test pattern 21D. Accordingly,L_(ij) can be the parameter which represents the size of one of the testpatterns 21D, i.e. L_(ij) is the parameter representing the size of theith cross type test pattern 21D of the jth test chart layer 20D.Accordingly, d_(ij) is the parameter which represents the distance froma cross type test pattern 21D of a test chart layer 20D to a center ofthe test chart layer 20D. Furthermore, set ΔF as the parameter whichrepresents the allowable range of the span of testing field of view, sett′ as the parameter which represents the error tolerance formanufacturing the cross type 3D test chart 100D, set n′ as the parameterwhich represents the index of refraction of the cross type 3D test chart100D, set s′ as the parameter which represents the allowable disc ofconfusion during a calculating step of a software, and a functionalequation regarding the size of the cross type test pattern 21D is asfollows: L_(ij)=f″(dij, ΔF, t′, n′, s′). Accordingly, the size of eachcross type test pattern 21D can be obtained by calculating the value ofL_(ij) based on the above mentioned functional equation.

It is worth mentioning that the process for calculating the size L_(ij)of the cross type test pattern 21D is a procedure for balancing eachparameter of the cross type 3D test chart with the error tolerance formanufacturing the cross type 3D test chart 100, and when the size L_(ij)of the cross type test pattern 21D is determined, the error tolerancefor manufacturing the cross type 3D test chart 100D is determined. It isstill worth mentioning that when the parameters of the cross type 3Dtest chart are determined, the cross type 3D test chart can bemanufactured based on these parameters.

It is still worth mentioning that since the types of the photographicarrangements 10 can be different, the focal length, the bore diameter,the area range of the image, the size of the imaging unit of the imagesensor 12 of different types of the photographic arrangement 10 arevaried from each other. In addition, the precision requirement fortesting the photographic arrangement 10 as well as the distance from thecross type 3D test chart to the photographic arrangement 10 isconsidered to calculate the parameters of the cross type 3D test chart.

Furthermore, according to an embodiment of the present invention, thesize of the shape of each cross type test pattern 21D in the imageshould be the same. For example, when the shape of each cross type testpattern 21D appears in the image, the width and length of the shape ofeach cross type test pattern 21D is required to be concurrent, and thenthe person of ordinary skilled in the art should understand the widthand length of each cross type test pattern 21D of the cross type 3D testchart in the predetermined space should be varied from each other.

In addition, according to an embodiment of the present invention, inorder to ensure that each cross type test pattern 21D can be projectedto the designated viewing area in the image, the location for the imageelement formed corresponding to each cross type test pattern 21D in theviewing area of the image is designated, and then a back projectionmethod is used to determine the position of each cross type test pattern21D, so that the position and size of each cross type test pattern 21Dof the test chart layer 20D of the cross type 3D test chart can bequickly obtained.

After determining the position and size of each cross type test pattern21D, it is required to analyze the error when the image elementcorresponding to each cross type test pattern 21D appears in the image.For example, the material of the test chart layer 20D may cause theimage elements of the cross type test patterns 21D in the image to benot concurrent and not to be appear at right positions. The contrastbetween the cross type test pattern and the corresponding test chartlayer should be determined based on the above mentioned reason andextent of the error when each cross type test pattern is projected tothe image.

It is worth mentioning that the media for forming each test chart layer20D can be tangible material, or the cross type test patterns can bedirectly provided in the air. More specifically, as shown in FIG. 19,tangible material, such as organic or inorganic glass, transparentdisplay screen, and material with a high index of reflection, can beused to form the cross type 3D test chart, so as to guarantee thecontrast between the cross type test patterns and the tangible materialof the test chart layers. When a projection method is employed, the testpatterns can be formed in a predetermined space by means of theprojection method. Suitable projection arrangement such as the devicessimilar to the projection source 50B and 50C can be employed, and thepresent invention are not limited by the above mentioned examples.

It is still worth mentioning that when the design of the cross type 3Dtest chart is accomplished, it is required to test and analyze theapplication of the cross type 3D test chart. Accordingly, when the imageformed by means of the cross type test patterns 21D meets therequirements, and there are no overlapping and interfering problems,then the job of the design of the cross type 3D test chart is finished.When there are interfering problems for the image formed by means of thecross type test patterns 21D, the error tolerance should be calculatedagain to reset the layout such as the size and density of the cross typetest patterns 21D.

Correspondingly, the present invention further provides a method forforming the cross type 3D test chart, wherein the method comprises thestep of forming a plurality of cross type test patterns 21 in adirection along a depth thereof which do not overlap when they areprojected to an image space to form an image.

Preferably, the method further comprises the step of collecting theparameters and precision requirements of the photographic arrangement 10to be tested, and determining the position configuration of the crosstype 3D test chart and the number of the layers of the test chart layers20D.

More specifically, set a as the parameter which represents the precisionrequirement for fitting the back focus of the photographic arrangement10 to be tested, set EFL as the parameter which represents the focallength, set h as the parameter which represent the positionconfiguration of the cross type 3D test chart 100D, then h_(j)represents the position of the jth layer of the test chart layers 20D,and the functional equation reflecting the position of the test chartlayers is as follows: a=−((EFL*(−hj)/(EFL−hj)−(EFL*(−h)/(EFL−h))).Accordingly, based on the above functional equation, the value of h_(j)can be calculated to determine the position of each test chart layer 20Dof the cross type 3D test chart 100D.

In addition, set n as the parameter which represents the number of thelayers of the test chart layers 20D, set t as the parameter whichrepresents the error tolerance of the photographic arrangement 10 whichis predetermined by the manufacturing process, set s as the parameterwhich represents the number of the moving steps of the photographicarrangement 10, and then obtain the functional equation regarding thenumber of the layers of the test pattern payers 20D as follows: n=f(t,a, s). Therefore, the quantity of the test chart layers 20D can bedetermined by obtaining the value of n.

Preferably, in the above method, when the position configuration of thecross type 3D test chart and the quantity of the test chart layers 20Dare determined, the error tolerance of the material of the test chartlayers 20D as well as other error tolerances may be considered todetermine the layout of the cross type test patterns 21D.

According to an embodiment of the present invention, set d as theparameter which represents the layout of the cross type test patterns21D, and d_(ij) is a parameter which represents a distance from a crosstype test pattern 21D of a test chart layer 20D to a center of the testchart layer 20D, set F as the parameter which represents the testingfield of view of the photographic arrangement 10, and obtain thefunctional equation representing the layout of the test patterns asfollows: d_(ij)=f′(F, h_(ij), EFL). Thus, the value of the parameterd_(ij) can be respectively calculated based on the above formula toobtain the layout of the cross type test patterns 21D.

Furthermore, set L as the parameter which represents the size of eachcross type test pattern 21D and L_(ij) can be the parameter representingthe size of the ith cross type test pattern 21D of the jth test chartlayer 20D, set t′ as the parameter which represents the error tolerancefor manufacturing the cross type 3D test chart 100D, set n′ as theparameter which represents the index of refraction of the cross type 3Dtest chart 100D, set s′ as the parameter which represents the allowabledisc of confusion during a calculating step of a software, set ΔF as theparameter which represents the allowable range of the span of testingfield of view, and then obtain a functional equation regarding the sizeof the cross type test pattern 21D as follows: L_(ij)=f″(dij, ΔF, t′,n′, s′). Accordingly, the size of each cross type test pattern 21D canbe obtained by calculating the value of L_(ij) based on the abovefunctional equation.

According to another preferred embodiment of the present invention, whendesigning the layout of the cross type test patterns 21A, a cross typeimage may be formed at first, and then uses a back projection method toobtain the configuration of the cross type 3D test chart, so that thecross type 3D test chart provide a plurality of test patterns extendingalong different depths.

It is worth mentioning that during determining the parameters of thecross type test chart, at least one predetermined position can bedetermined at each test chart layer 20D, and at least one test pattern21D is provided at the predetermined position. And then, a plurality oftest chart layers 20D are overlapped in such a manner that each crosstype test pattern 21D of a test chart layer 20D does not overlap withcross type test patterns 21D of other test chart layers 20D, so thatthere is no interfering problem in the image formed by means of theprojection of the 3D test chart.

According to an embodiment of the present invention, each cross typetest pattern 21D can be formed on a surface of the corresponding testchart layer 20D. For example, each cross type test pattern 31D can beprepared and then is attached to the surface of the corresponding testchart layer 20D, and the plurality of test chart layers 20D areoverlapped to form the cross type 3D test chart. According to anotherexample of the present invention, each cross type test pattern 21D canbe formed in the corresponding test chart layer 30D, so that thereliability of the cross type 3D test chart for testing the photographicarrangement 10 is ensured.

Referring to FIGS. 23 and 24 of the drawings, when the cross type 3Dtest chart is used for testing the photographic arrangement 10, a lightsource 40D may be employed to enhance the contrast between the crosstype test patterns 21D and the corresponding test chart layers 20D, sothat the information of each cross type test pattern 21D can be easy tobe captured by the photographic arrangement 10.

More specifically, as a first example, referring to FIG. 23 of thedrawings, the light source 40D is provided at a position to configurethe cross type 3D test chart to be arranged between the light source 40Dand the photographic arrangement 10, so that light beams of the lightsource 40D pass through the test chart layers 20D to enhance thecontrast between each cross type test pattern 21D and corresponding testchart layer 20D, so that each test pattern 21D can be easily identifiedand captured by the photographic module 11.

As a second example, referring to FIG. 24 of the drawings, the lightsource 40D and the photographic arrangement 10 can be arranged at thesame side of the cross type 3D test chart. Accordingly, one or morelight sources 40D can be provided to produce evenly projecting lightbeams which pass through the test chart layers 20D and also enhance thecontrast between each cross type test pattern 21D and the correspondingtest chart layer 20D. In comparison with the transmissive 3D test chartof the above first example, the difference of the 3D test chart of thissecond example is that it is a reflective test chart for testing thephotographic arrangement 10.

FIG. 25 illustrates the image formed by projecting each test pattern 21Dinto the image space when testing the photographic arrangement 10, thelengths and widths of the lines of the cross type test patterns 21D ofthe cross type 3D test chart in the predetermined space may bedifferent, so that the lengths and widths of the image elements formedby means of the cross type test patterns 21D may be the same, so that itis convenient for analyzing the imaging resolution of the photographicarrangement 10.

Referring to FIGS. 26 and 27 of the drawings, a projection method can beused to provide the plurality of test patterns 21D in different spaces.

More specifically, referring to FIG. 26 of the drawings, a projectionsource 50D is provided at a light path of the light source 40D. In otherwords, the light beams reach to the projection source 50D and thenproject out to form a plurality of cross type test patterns 21D which donot overlap with each other by the light beams of the light source 40Dacting on the projection source 50D. Accordingly, two adjacent crosstype test patterns 21D are spacedly arranged with other to from thecross type 3D test chart, so that there is no interfering problem in theimage. In addition, the light source 40D and the projection source 50Dcan be provided at a lateral side of the predetermined space, and theprojection source 50D can be provided at a position between the lightsource 40D and the predetermined space, so that the light beams producedby the light source 40D can project the information of the projectionsource 50D to the predetermined space for forming the plurality of crosstype test patterns 21D of the 3D test chart 100D.

Referring to FIG. 27 of the drawings, the light source 40D and theprojection source 50D are provided above the reserved space for formingthe 3D test chart 100D. Furthermore, the projection source 50D comprisesa planar test chart 51D and a focus zooming lens set 52D. Accordingly,the planar test chart 51D, which is provided between the light source40D and the focus zooming lens set 52D, includes at least one cross typetest object 511D, so that the light beams of the light sources 40D reachto the cross type test object 511D and form the cross type 3D test chart100D by means of the focus zooming lens set 52D.

It is worth mentioning that the person of ordinary skilled in the artshould understand that the cross type 3D test chart can be prepared byother methods, and the above cross type 3D test charts are exemplaryonly and do not limit the present invention.

In addition, when testing the photographic arrangement 10 using thecross type 3D test chart, the testing method regarding the imagingquality can be any method, which can evaluate the imaging resolution ofthe photographic arrangement 10, can be selected from the groupconsisting of OTF(Optical Transfer Function), MTF(Modulation TransferFunction), SFR(Spatial Frequency Response), CTF(Contrast TransferFunction) and the combination thereof. Preferably, the MTF(ModulationTransfer Function) method can be used. The person of ordinary skilled inthe art should understand that other methods also can be used toevaluate and test the imaging quality of the photographic arrangement10.

It is still worth mentioning that although the photographic arrangement10 described in the specification is illustrated to comprises thephotographic module 11 and the image sensor 12, the photographic module11 may comprises one or more lens, and optionally a voice coil motor(not shown in the drawings), the image sensor 12 may be provided with aPCB board (not shown in the drawings). In other words, other possiblecomponents may be provided for facilitating the operation of thephotographic module 11 and the image sensor 12.

Referring to FIGS. 28 to 35 of the drawings, a testing method, anadjusting method, and an adjusting arrangement corresponding to theadjusting method according to a preferred embodiment of the presentinvention are illustrated. The testing method of the present inventiontests parameters such as the focal points and the tilt of thephotographic module 11 and the image sensor 12. Accordingly, thepositions of the photographic arrangement 10 and the image sensor 12, aswell as the relative position therebetween are adjusted in thesubsequent adjusting process, so that the photographic arrangement 10and the image sensor 12 are respectively adjusted to suitable positions,sot that the high imaging quality of the photographic arrangement isensured.

Referring to FIG. 36 of the drawings, the adjusting arrangementcomprises a 3D test chart 100, an adjusting unit 200 and other possiblecomponents such as the light source. Accordingly, the 3D test chart 100comprises a plurality of test patterns 21 which provides scenes ofvarious different depths, so that when testing the photographicarrangement 10, a single shooting action of the photographic arrangement10 is able to provide an image with information of different depths.More specifically, the 3D test chart 100 comprises a plurality of testpatterns 21 which do not overlap with each other and are arranged in adirection along a depth thereof, two adjacent test patterns 21 arespacedly arranged, so that when the photographic arrangement 10 is usedto capture the information of the 3D test chart, an image withinformation of different depths can be obtained.

According to the present invention, before testing the photographicarrangement 10, it is a necessary step for establishing a plurality oftest patterns 21 which are arranged in different depths. And then, animage with information of different depths can be obtained by shootingthe test patterns 21 with the photographic arrangement 10. According tothis preferred embodiment of the present invention, forming the 3D testchart of the present invention is able to provide test patterns 21 indifferent depths.

More specifically, the 3D test chart 100 comprises a plurality of testchart layers 20 which are arranged in a direction along a depth thereof,each test chart layer 20 is provided with at least one test pattern 21,and the test pattern 21 of one test chart layer 20 does not overlap withother test patterns 21 of other test chart layers 20 arranged indifferent depths.

After the parameters of the 3D test chart 100 are determined, the personof ordinary skilled in the art should understand the quantity of thetest chart layers 20 of the 3D test chart 100 is n=j, wherein j>1. Eachof the parameters h₁ to h_(j-1) represents the pitch of each test chartlayer (a distance between adjacent test chart layers). Each of theparameters from U₁ to U_(j-1) represents the object distance of eachtest pattern 21, and each of the parameters from V₁ to V_(j-1)represents the image distance of each test pattern 21. In other words,test patterns 21 of different test chart layers have different objectdistances and image distances. Set m_(i)n_(j) as a parameterrepresenting a serial number of the test pattern 21, wherein jrepresents the layer number of the test chart layer 20 while irepresents the designated number of the test pattern 21, wherein i>1. Inother words, two or more test patterns 21 can be provided at each testchart layer 20. Alternatively, each test chart layer 20 may also beprovided with a single test pattern 21 in other examples. In addition,the image element corresponding to each test pattern 21 is designated asm′_(ij).

Referring to FIG. 31 of the drawings, a configuration of the 3D testchart 100 according to a preferred embodiment of the present inventionis illustrated, the shape of each test pattern 21 can be adjustedaccording to actual requirements. In the testing method, when the testpatterns 21 of different depths of the 3D test chart 10 are shot by thephotographic arrangement 11, the corresponding resolution values areobtained. Set mtf_((ij)) as the parameter representing the resolutionvalue of each test pattern 21, set ω as the parameter representing theshape of each test pattern 21, set (h,d) as the parameter representingthe position configuration of each test pattern 21, set s as theparameter representing the intensity of the light source, and then afunctional equation regarding the resolution value of each test pattern21 is as follows: mtf_((ij))=f(ω, h, d, s).

Referring to FIG. 28, a flow chart illustrating the testing andadjusting process of the photographic arrangement 10 with scenes ofdifferent depths is shown. More specifically, when testing thephotographic arrangement 10 with the testing method of the presentinvention, the photographic module 11 and the image sensor 12 are placedat initial positions, i.g. the image sensor 12 is placed at apredetermined position at the adjusting unit 200, and then thephotographic module 11 can be clasped and delivered to a correspondinginitial position so as to align the photographic module 11 with theimage sensor 12, so that the photographic module 11 cooperates with theimage sensor 12 to obtain images of the test patterns 21 of the 3D testchart 100.

Accordingly, the photographic arrangement 10 is placed at the initialposition to shoot a picture about the test patterns 21. It is worthmentioning that the test patterns 21 of different depths of the 3D testchart will appear in the same image, so that a single image can provideinformation of the test patterns of different depths, and thecorresponding resolution values corresponding to each test pattern 21can be calculated out. The person of ordinary skilled in the art shouldunderstand that the different depths of the 3D test chart meansdifferent image distances can be provided. In other words, differentimage distances are respectively provided between the test patterns 21of the 3D test chart 100 and the photographic arrangement 10, so thatthe image information can be used to provide a functional formularegarding the imaging resolution and defocus amount of each test pattern21.

Accordingly, the functional equation regarding the imaging resolutionand defocus amount of each test pattern 21 is as follows:F ₀ =F _((v)) {mtf ₍₀₁₎ , mtf ₍₀₂₎ , mtf ₍₀₃₎ . . . tmf _((0j))},F _(j) =F _((v)) {mtf _((i1)) , mtf _((i2)) , mtf _((i3)) . . . mtf_((ij))}.

Set P as the parameter representing the focal point, and the person ofordinary skilled in the art is able to calculate out the focal points ofthe test patterns 21 as P₀ to P_(j). P_(o) represents the focal point ofthe center of test patterns 21 of the 3D test chart 100, and also P_(o)is referred to the focusing position of the photographic arrangement 10.

According to an embodiment of the present invention, after calculatingout the focal point, curves F₀ to F₄ indicating the relationship betweenthe imaging resolution and image distance are obtained, as shown in FIG.30. Accordingly, curve F₀ represents the functional curve correspondingto the central field of view (m₀), curves F1 and F3 represent thefunctional curves of imaging resolutions corresponding to test patternsin field of views m₁ and m₃, which are left-right symmetrical withrespect to the center thereof respectively, while curves F2 and F4represent the functional curves of imaging resolutions corresponding totest patterns in field of views m₂ and m₄, which are up-down symmetricalwith respect to the center thereof. As shown in FIG. 30, the person ofordinary skilled in the art should understand that when the focusingposition of the central field view overlaps with the optical center ofthe image sensor 12 (the largest value of F_(o)), and the defocusdistances of the four positions (m₁, m₂, m₃, m₄) are larger than 10 μm.That is to say, a tilt exists in the photographic arrangement 10, andthus a unilateral image blur shall occur, as shown in FIG. 31.

During the above procedure, the testing method is able to use thefunctional equation regarding the imaging resolution and defocus amountto calculate out the tilt vector of the photographic arrangement 10, andthen the adjusting unit 200 is employed to adjust the configuration ofthe photographic arrangement 10, and then obtain images shown in FIGS.32 and 33, and the defocus distances of the four positions (m₁, m₂, m₃,m₄) are less than 3 μm, the tilt of the image plane is thus corrected,even images are provided corresponding to the four areas of m₁, m₂, m₃,and m₄, and the imaging resolution thereof is improved, indicating thatthe imaging quality of the photographic arrangement is greatly improved.

Referring to FIG. 34, when employing the adjusting arrangement to testand adjust the photographic arrangement 10, the image sensor 12 may beprovided at the adjusting platform of the adjusting unit 200, such as asix-axis adjusting device or other multi-axis adjusting device, and thephotographic module 11 is then aligned with the image sensor 12 in sucha manner that the photographic module 11 is provided between the 3D testchart 100 and the adjusting platform. Referring to FIG. 35, each testpattern 21 of the 3D test chart is designated with an image distance,when the photographic module 11 and the image sensor 12 are used tocapture information of each test pattern 21 of the 3D test chart 100, animage containing information of different depths is obtained.

Referring to FIG. 28, when the tilt vector of the photographicarrangement 10 is obtained, the corresponding adjusting order is inputto the adjusting unit 200 to adjust the configuration of thephotographic module 11 and the image sensor 12 as well as the relativeposition therebetween, so as to improve the imaging quality of thephotographic arrangement 10.

It is worth mentioning that the focusing position and the tilt vector ofthe photographic arrangement 10 can be obtained based on the same imageand the same functional equation. When the adjusting order is input, theadjusting platform will simultaneously accomplish the adjusting processfor correcting the focusing position and the tilt of the image plane ofthe photographic arrangement 10, so that the efficiency for testing andadjusting the photographic arrangement 10 is greatly improved.

Furthermore, after finishing the adjusting process of the photographicarrangement 10, it is required to evaluate the adjusting result to thephotographic arrangement 10, so that the above steps are repeated totesting and calculating the imaging resolution. If the imagingresolution of the photographic arrangement 10 meets the requirements,then it is assumed that the adjusting process by the adjustingarrangement is effective, and then a solidifying process is carried outthe fix up the photographic module 11 and the image sensor 12. If theimaging resolution of the photographic arrangement 10 does not meet therequirements, then it is assumed that the adjusting process by theadjusting arrangement is not enough, a subsequent adjusting processshould be carried out. It is worth mentioning that according to anembodiment of the present invention, when excessive adjusting steps, forexample three times, are carried out but the desired adjusting effectstill cannot be achieved, then there may be serious problem in thephotographic arrangement 10, so that no further adjusting steps need tobe carried out.

Accordingly, as shown in FIG. 39, the present invention provides amethod for testing the photographic arrangement 10 which comprises aphotographic module 11 and an image sensor 12, wherein the methodcomprises the following steps.

(a) Configure a plurality of test patterns 21 in a direction along adepth thereof to provide a plurality of scenes of different depths.

(b) Capture the image information of the plurality of test patterns 21though shooting the 3D test chart 100 by the photographic arrangement10.

(c) Based on the image information, obtain a focal position of thephotographic module 11, and a tilt vector of the photographic module andthe image sensor 12, and determine the relative position of thephotographic module 11 and the image sensor 12.

Preferably, as shown in FIG. 31, in the step (a), the 3D test chart 100is configured to comprise a plurality of test chart layers 20 eachproved with at least one test pattern 21, wherein each test pattern 21of one test chart layer 20 does not overlap with other test patterns 21of other test chart layers 20 in the direction along the depth thereof.

Preferably, in the step (a), the method further comprises the steps of:(a.1) collecting the parameters of the photographic arrangement 10 todetermine the position configuration of the 3D test chart 100; and (a.2)Determining a quantity of the test chart layers, configuring a layout ofthe test patterns of the test chart layers based on precisionrequirements of the photographic arrangement 10. In addition, the methodmay still comprise a step of (a.3): determining a size of each testpattern.

Accordingly, as shown in FIG. 40, the present invention further providesa method for adjusting the photographic arrangement 10, wherein themethod comprises the following steps.

(α) Capture information of scenes of different depths of a 3D testchart, determine a relative position of a photographic module 11 and animage sensor 12 of the photographic arrangement 10, and obtain relateddata corresponding to the relative position.

(β) Based on the related data, accomplish an adjusting process of thephotographic module 11 and the image sensor 12.

Preferably, the method may comprise the step of obtaining an imagecontaining the information of scenes of different depths throughshooting the test patterns 21 of the 3D test chart 100, wherein theplurality of test patterns 21 of the 3D test chart 100 do not overlapwith each other, and two adjacent test patterns in the direction alongthe depth are spacedly arranged with each other.

One skilled in the art will understand that the embodiment of thepresent invention as shown in the drawings and described above isexemplary only and not intended to be limiting.

It will thus be seen that the objects of the present invention have beenfully and effectively accomplished. The embodiments have been shown anddescribed for the purposes of illustrating the functional and structuralprinciples of the present invention and is subject to change withoutdeparture from such principles. Therefore, this invention includes allmodifications encompassed within the spirit and scope of the followingclaims.

What is claimed is:
 1. An adjusting arrangement for adjusting aphotographic arrangement, comprising: a 3D test chart comprising aplurality of test patterns which are arranged in a direction along adepth thereof, wherein said test patterns do not overlap with eachother, wherein two adjacent said test patterns are spacedly aligned witheach other, wherein said photographic arrangement is arranged to shootsaid 3D test chart to obtain an image containing information of scenesof different depths provided by said test patterns; and an adjustingunit for accomplishing an adjusting process of said photographicarrangement based on data provided by said information of scenes ofdifferent depths, wherein set a as a parameter which represents aprecision requirement for fitting a back focus of a photographicarrangement to be tested, set EFL as a parameter which represents afocal length, set h as a parameter which represent a positionconfiguration of said 3D test chart, wherein h_(j) represents a positionof jth layer of said test chart layers, wherein a functional equationregarding a position configuration of said test chart layers is asfollows: a=−((EFL*(−hj)/(EFL−hj)−(EFL*(−h)/(EFL−h))).
 2. The adjustingarrangement, as recited in claim 1, wherein set n as a parameter whichrepresents a quantity of said test chart layers, set t as a parameterwhich represents an error tolerance of said photographic arrangement,set s as a parameter which represents a quantity of moving steps of saidphotographic arrangement, and then a functional equation regarding saidquantity of said test pattern layers is as follows: n=f(t, a, s).
 3. Theadjusting arrangement, as recited in claim 2, wherein set d as aparameter which represents a layout of said test patterns, whereind_(ij) is a parameter which represents a distance from one of said testpattern of said corresponding test chart layer to a center of said testchart layer, set F as a parameter which represents a testing field ofview of said photographic arrangement, wherein a functional equationregarding said layout of said test patterns is as follows: d_(ij)=f′(F,h_(ij), EFL).
 4. The adjustment arrangement, as recited in claim 3,wherein set L as a parameter which represents a size of each cross typetest pattern and Uj is a parameter representing a size of ith testpattern of jth test chart layer, set t′ as a parameter which representsan error tolerance for manufacturing said 3D test char, set n′ as theparameter which represents an index of refraction of said 3D test chart,set s′ as a parameter which represents an allowable disc of confusionduring a calculating step of a software, set AF as a parameter whichrepresents an allowable range of a span of testing field of view, and afunctional equation regarding said size of said test pattern is asfollows: L_(ij)=f (d_(ij), AF, t′, n′, s′).
 5. The adjustingarrangement, as recited in claim 1, further comprising a plurality oftest chart layers, each of which is provided with at least one of saidplurality of test patterns, wherein each of said plurality of testpatterns of one of said plurality of test chart layers does not overlapwith other said plurality of test patterns of other said plurality oftest chart layers.
 6. The adjusting arrangement, as recited in claim 5,wherein a shape of said plurality of test patterns is selected from thegroup consisting of a square shape, a triangular shape, a circularshape, an oval shape, a cross shape, a shape of a pair of black andwhite lines, a star shape, and the combination thereof.
 7. The adjustingarrangement, as recited in claim 1, wherein said 3D test chart is formedas a chart selected from the group consisting of a transmissive testchart, a reflective test chart, a projection test chart, and a focuszooming and imaging type test chart.
 8. The adjusting arrangement, asrecited in claim 1, further comprising a light source, wherein saidlight source and said photographic arrangement are respectively providedat two opposite sides of said 3D test chart.
 9. The adjustingarrangement, as recited in claim 1, further comprising a light source,wherein said light source and said photographic arrangement are providedat a same side of said 3D test chart.